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Home Products Systems AFM in SEM Ultra compact, UHV-AFM for usage with RDD-Cantilever

Description


The AFM in SEM from the nano analytik GmbH is not only used for imaging, it is capable to be employed for metrology as well.

For this purpose, we are offering a compact-AFM system, applicable in any SEM without chamber modification, for micro manipulation and metrology scanning.

The XYZ6X-Stage is a non-magnetic, closed-loop XYZ nanopositioner with a 60μm x 60μm x 20μm range (Position Noise (nm): x,y = 0.4; z = 0.2) of motion and an extremely low out-of-plane motion. It has the high resonant frequency (x,y = 750Hz; z = 2000Hz) and is designed for space-constrained applications that require high-precision positioning. Furthermore, the actuators are offering manipulation capabilities in the range of 1,5 cm in X, Y and Z with a precision of 3 nm.

Request

AFM operating under

room and vacuum conditions

Room conditions

Vacuum conditions

No machine downtime of the AFM or your SEM tool, due to AFM operation capability in vacuum
and air



Fast installation in less than 5 min

System Data

Value

Vacuum-Suitability

Mesurement-Head is full vacuum compatible

Maximum XY-range (resolution)

60 µm (0,4 nm)

Maximum Z-range (resolution)

20 µm (0,2 nm)

Maximum XY-addressing field  (resolution)

18 x 18 mm (3 µm)

Maximum sample size / height

ø 70 mm / 6 mm

Navigation camera

Optional available for air operation

Approach

8 mm full automatic or step-by-step approach

Imaging modes

DC, AC, Phase Contrast, Fwd & Bwd, Force gradient modulation freqency phase modulation

Spectroscopy modes

Force-Distance, Amplitude-Distance

Advanced modes

Current-Distance, Lithography, Q-Control, MFM, EFM

Size (LWH) / Weight

 108x70x50 mm / 360 g

Mounting

Flexible for most of the existing SEM tools

Specifications

Videos

Special Application: SII

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