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Phone +49 (0)3677/4690 112 - info@nanoanalytik.net

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Description


Based on advanced nanotechnology knowledge, nano analytik GmbH has developed a novel AFM as a versatile, compact and extremely simple to use atomic force microscope (AFM) tool, allowing a huge variation of applications. The new nano analytik system has been developed in order to provide high-speed nano-scale imaging by "non-optical" so called “Rangelow-type” cantilevers. These cantilevers have an integrated sensor and actuator and make the necessity of complex manual AFM laser adjustments redundant. In particular, this system is very well suited for chemical or biological detection/recognition in the fields of Materials- or Life-Science applications. This unique and high precision measurement instrument has been designed to be highly flexible. It can be easily employed for e.g. chemical or bio-sensing, making it the first characterization system that allows investigation and calibration of diverse piezoresistive or capacitive cantilevers. The nano analytik system has been developed to be a user-friendly nano-tech tool with an open modular architecture, making this remarkable instrument easy to be expanded or modified on customer demand.

 

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System Data

Value

Comment

Vacuum-Suitability

No, (Yes) Can be ordered


Possible cantilever technology

Active / (Active)-on piezo-shaker

AFM-Canti

In-Situ capability

Liquids, Gases


Possible operating mode

Frequenz shift / Phase shift


Controller

Paan, Zelos, Kronos

Paan

Channels

min. 1

1

Resolution

min. 12 Bit

16 Bit

Bandwith

min. 50 MHz

50 MHz

Scanner

All Top-/ Bottom-Scanner

Carna-Scan

Resolution

NONE

0,3 nm

Motionrange (X, Y, Z)

NONE

15 µm, 15 µm, 4 µm

Videos

Special Configurations

Q-Control AFM

Q-Control

AFM-Atomic

Fast AFM

Fast AFM