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Description


The nano analytik high speed atomic force microscopy system with digital model-based Q control significantly increases the imaging rate and material contrast mapping capabilities. The controller allows to arbitrarily modify the dynamics of the first and higher cantilever eigenmodes. Using higher eigenmodes with decreased Q factors results in a dual effect that significantly increases the imaging bandwidth of the cantilever. Optimal imaging conditions can be easily set within the AFM control software. The flexible system can be operated in fluid, air and vacuum. In particular in vacuum cantilevers often suffer from high Q factors that strongly limit the scan rates. By increasing the cantilever’s internal damping fast scanning is even possible in such environments. As such, the Q controlled high speed AFM allows capturing fast nanoscale sample processes that are present in biological and chemical reactions.

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Figure 1 consists of two AFM images obtained with and without Q control. The left image is obtained with the cantilever’s natural Q factor. The right image is scanned with a lowered Q factor. The increased imaging rate is clearly visible.

System Data

Value

Comment

Vacuum-Suitability

No, (Yes) Can be ordered


Possible cantilever technology

Active / (Active)-on piezo-shaker

AFM-Canti, HFSPM, Tri, Fast Canti

In-Situ capability

Liquids, Gases


Possible operating mode

Frequenz shift / Phase shift


Controller

Kronos, Zelos

Kronos

Channels

min. 1

2

Resolution

min. 12 Bit

16 Bit

Bandwith

min. 70 MHz

100 MHz

Scanner

All Top-/ Bottom-Scanner

Pales-Scan

Resolution

NONE

X,Y: 0,2 nm; Z: 0,03 nm

Motionrange (X, Y, Z)

NONE

20 µm, 20 µm, 5 µm

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