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Description


Shear-force detection is commonly used for distance control in many scanning probe related techniques. The nano analytik imaging technique is based on the self-actuated probe oscillating near its free resonant frequency parallel to the surface. Integrated piezoresistive read-out is used for the detection of the oscillations and their dependence on the probe–sample separation. The signal can be processed to perform both, amplitude-modulation and frequency-modulation feedback. Oscillation amplitude is ranging from 1 to 5 nm.


System Data

Value

Comment

Vacuum-Suitability

No, (Yes) Can be ordered


Possible cantilever technology

Active / (Active)-on piezo-shaker

ShFM

In-Situ capability

Liquids, Gases


Possible operating mode

Frequenz shift / Phase shift


Controller

Zelos, Kronos

Zelos

Channels

min. 1

1

Resolution

min. 12 Bit

16 Bit

Bandwith

min. 50 MHz

50 MHz

Scanner

All Top-/ Bottom-Scanner

Adeona-Scan

Resolution

NONE

0,03 nm

Motionrange (X, Y, Z)

NONE

15 µm, 15 µm, 4 µm

Shear-Force AFM Enabeling the facilities of Rangelows Shear-Force Cantilever

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