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Phone +49 (0)3677/4690 112 - info@nanoanalytik.net

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Description


A shear force mechanism (ShFM) is used as a distance control in AFM microscope. nano analytik’s self-actuated, piezoresistive probes offering a simple and sensitive operation and capable of imaging both hard-material and biological system surfaces repeatedly and nondestructively.  Self-actuated, self-sensing scanning probe sensors are offering reliable operation in multi-resonance mode RDD- technique.  This mode offers atomic resolution operation at acceptable scanning speed and fast operation in liquids.


Guaranted atomic step resolution


The high resolution inherent in these probes enables its use in a wide array of applications, ranging from topographic imaging, nanofabrication, and surface phenomena studies. Moreover, with digital signal processor controlled fast phase-tracking data acquisition electronics of nano analytik, thousands of pixels can be gathered in extremely short period of time.

Cantilever Data

Value

Typical variation

Application

Non contact, contact mode (90° to Surface)


Possible operating mode

Active / passive


   Actuation

Yes, thermally driven actuator


   Readout

Yes, piezoresistive


Material

Si


Dimensions

W = 120 µm

+/- 5 µm


L = 350 µm

+/- 10 µm


T = 3 - 5 µm is possible

+/- 1 µm

Tip hight

In plane

–-

Tip position from top

–-

–-

Force Constant

20 N/m

+/- 10 N/m

Resonance Frequency

f = 30 - 50 kHz is possible

+/- 5 kHz

Possible Coatings

Upon request, reflective backside-coating of proven materials


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