Contact | Disclaimer | Imprint


© 2010 nano analytik GmbH, Ehrenbergstr. 1 - 98693 Ilmenau - Germany

Phone +49 (0)3677/4690 112 - info@nanoanalytik.net

Contact Disclaimer Impressum

Principle of operation

Home

Scanning Probe based tool for Single Ion Implantation


Future development of an accessible quantum computer has emerged as a premiere challenge for the development of completely novel approaches in nanofabrication and nanotechnology in the last decade.


Spins of electrons and nuclei of dopant atoms embedded in silicon are promising quantum qubit candidates. Nanoanalytik GmbH developed single atom doping technology and the status of our development of single atom qubit arrays. Based on a ''top down'' Field-Emission Scanning Probe Lithography (FE-SPL) approach for the realization of control gates and readout SET structures become realistic goal. Our FE-SPL is used for fabrication of Single electron transistors (SETs), which make possible the control of quantum transport through a zero-dimensional island, source and drain, and gate electrodes. Our scanning probe Single Ion Implantation tool fulfill the requirements for realization of qubit array, and integration with a whole semiconductor processing.

Products Request Contact Supplier » Order Cantilever

System Data

Value

Comment

Vacuum-Suitability

Mesurement-Head is full vacuum compatible


Possible cantilever technology

Active / (Active)-on piezo-shaker

AFM-Canti, HFSPM, Tri, Fast Canti

In-Situ capability

Liquids, Gases


Possible operating mode

Frequenz shift / Phase shift


Controller

Kronos

Kronos

Channels

min. 1

2

Resolution

min. 12 Bit

16 Bit

Bandwith

min. 50 MHz

100 MHz

Scanner

All Top-/ Bottom-Scanner

Adeona-Scan

Resolution

NONE

0,03 nm

Motionrange (X, Y, Z)

NONE

15 µm, 15 µm, 4 µm

Home / Products / Systems / AFM Atomic

Home Products Systems