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Phone +49 (0)3677/4690 112 - info@nanoanalytik.net

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For the highest productivity of our AFM-Systems, the cantilevers are manually exchangeable in less than 10 sec.

A fast approach technology allows a tip-to-sample approach time of approximately 5 seconds from more than 2 mm above the sample surface and an imaging time of less than 20 seconds.


Scanning speeds of 100 l/sec. (10 µm x 10 µm scan area, 50 nm topography height and 256 pixels/line) are routinely achieved using a novel adaptive scan speed control.

Measurement Systems

nanoMETRONOM

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AFM in SEM

IAQ Attobalance

Shear-Force AFM

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