See the unseen.
Atomic Resolution With Ease.
Active cantilever Atomic Force Microscopy with integrated actuation and sensing technology for fast, precise, and reliable nanoscale measurements across research and industrial applications.
Atomic Resolution With Ease.
Active cantilever Atomic Force Microscopy with integrated actuation and sensing technology for fast, precise, and reliable nanoscale measurements across research and industrial applications.
Self-driven, self-sensing probes
Our cantilevers integrate both actuation and sensing directly into the cantilever — called active cantilevers. A built-in thermomechanical actuator drives cantilever motion, while a piezoresistive sensor measures displacement through resistance changes at the cantilever. By eliminating external optical detection, this architecture reduces system complexity and enables a more compact AFM system for precise, reproducible atomic-scale imaging.
Built-in thermomechanical actuator drives the cantilever directly, enabling fast amplitude control and stable resonance excitation.
The piezoresistive wheastone bridge detects cantilever motion through resistance changes, without requiring optical beam detection.
Tip-sample interactions are mapped into high-resolution topography image through feedback controlled scanning.
Want to go deeper into the physics behind our active probes?
Explore Knowledge Centre →No complex optical alignment required — simply insert the probe and start measuring.
Designed for flexible integration into complex platforms including SEM and custom instrumentation.
Sub-nm resolution and high-speed scanning performance across air, liquid, and vacuum environments.
Arrays of active cantilevers enable parallel imaging and metrology, opening the way to high-throughput, large-area nanoscale inspection.
Talk to our technical team about your specific research requirements.