Precision AFM without complexity

nano analytik GmbH aims to bring novel nano-scale Atomic Force Microscopy (AFM) technologies into industrial practice, enabling groundbreaking active-cantilever–based AFM metrology. We are a leading innovator and partner in the field of scanning-probe technology systems that use active cantilevers as a breakthrough solution. We have expanded and standardized the use of active cantilevers as a successful replacement for traditional OBD solutions, without compromising AFM performance, to enable faster and deeper metrology insight. Consequently, there are no limits to the size or mass of the sample for the AFM — one of our biggest contribution towards simplifying AFM and delivering extremely user-friendly AFMs with an excellent price–performance ratio for process control in advanced semiconductor manufacturing.

We are pioneers in industrializing active cantilever, and we define ourselves by our ability to surpass goals and push the limits. In partnership with our customers, we create novel process-control and metrology solutions that accelerate value generation, creating a diverse and comprehensive portfolio of metrology AFM solutions to drive the development of the semiconductor industry. We focus in particular on the global industrial and research market at semiconductor companies, universities, and research laboratories. Our activities combine development, manufacturing, and trading to support the community with high-quality active cantilevers and scanning probe devices and robust high-precision hardware systems operating in liquids, air, or vacuum. Today, our instruments are used by leading research groups and industrial laboratories across Europe, North America, Australia and Asia.