News Type: Event Updates

SEMICON Korea 2026

We would like to express our gratitude to Dr. Joonho You, CEO of nexensor for his remarkable presentation at SEMICON Korea on high-throughput metrology for Chemical…

View

SPIE Novel Patterning Conference

We are pleased to highlight the remarkable invited presentation, “Scanning probe lithography-based mix-and-match technique as an enabling tool for the pilot production of nanowire-based next-generation…

View

4th Euro AFM Forum

Euro AFM Forum – Oxford Instruments, Asylum Research Announces the 4th Euro AFM Forum at Georg-August Universität Göttingen, March 17-19, 2014. In cooperation with TU…

View

SPIE Advanced Lithography Conference 2015

At the SPIE Advanced Lithography Conference 2015 (San Jose, USA) nano analytik GmbH presented a paper on high-speed AFM-tool for metrology. A significant improvement in…

View

NANOSCALE-2016 Conference

nano analytik GmbH demonstrated live at the NANOSCALE-2016 Conference (Wroclaw, Poland) recent developments in AFM Imaging with high-speed active cantilevers. Radically improved AFM efficiency and…

View

60th International Conference on EIPBN

The new Active Cantilever AFM belongs to the next generation atomic force microscopes. The German nanotechnology company nano analytik GmbH has presented the new AFMinSEM…

View

nano analytik GmbH at Sensor+Test Exhibition

At the Sensor+Test exhibition in Nürnberg, nano analytik GmbH presented the results of new scientific application of the AFMinSEM. Merging two state-of-the-art surface research techniques,…

View

nanoFIS Conference 2016

The most recent trend of technical innovation is the latest active cantilever technology developed at nano analytik GmbH, guaranteeing an extremely high AFM imaging productivity.…

View