Explore Navora AFM
A complete, plug-and-play active cantilever AFM system designed for high-resolution imaging without optical beam deflection (OBD). From industrial metrology to academic research, Navora AFM supports…
News Type: Company Highlights
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The project meeting for “Ultra-Fast Correlative Metrology PSIAFM”
The project meeting for “Ultra-Fast Correlative Metrology: PSIAFM” took place at Technische Universität Ilmenau from June 8 to 10, 2026. This EU-EUREKA project is developing…
Successful installation of CIQTEK FE SEM
nano analytik GmbH and CIQTEK announce the successful installation of a CIQTEK Field Emission Scanning Electron Microscope (FESEM) 5000X at Nano Analytik’s facility in Ilmenau,…
Master’s Thesis Advances Parallel Active Cantilever AFM Technology at Nano Analytik GmbH. Congratulations Richard Subianto !
🎓 Congratulations to Richard Subianto on the successful defense of his Master’s thesis, “Design and assembly of an Atomic Force Microscope (AFM) based on an…
Seasons greetings
Celebrating the holiday season with nanoscale precision — nano analytik thanks its partners, collaborators, and customers for a successful 2025 and wishes everyone a peaceful…
Master’s Thesis at Koç University showcases advanced nanoscale transistor fabrication using Nano Analytik GmbH technology. Congratulations Taner Altinmakas !
We’re proud to see our microscope system contributing to cutting-edge academic research! Congratulations to Taner Altinmakas on successfully defending his Master’s thesis: “Mix-and-Match Fabrication of…
Innovationspreis Thüringen Award
2016: AFMinSEM for single ion implantation was awarded a prize at Thüringer Innovationspreis in Weimar nano analytik GmbH is proud to announce that the single…
3rd place in “Best Poster” Competition, SPIE Photomask Technology + EUV Lithography 2019
A joint poster by nano analytik GmbH and Ilmenau University of Technology was awarded third place in the “Best Poster” competition at SPIE Photomask Technology…
Interview by AIP/AVS
2019: Scientists talk about Tip-Based Electron Beam Induced Deposition (TP-EBID) in AIP/AVS Interview Electron-beam induced deposition (EBID) with the help of a cantilever tip (TP-EBID)…
Advancing next-generation industrial inspection technologies together
We had a fantastic time at Fraunhofer Institute for Photonic Microsystems IPMS for the meeting on advanced and next-generation industrial inspection technologies.