News & Updates
Events & company updates
Conference appearances, research highlights, and the latest news from nano analytik.
Company Highlights
LinkedIn
The project meeting for “Ultra-Fast Correlative Metrology PSIAFM”
The project meeting for “Ultra-Fast Correlative Metrology: PSIAFM” took place at Technische Universität Ilmenau from June 8 to 10, 2026. This EU-EUREKA project is developing…
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LinkedIn
Advancing next-generation industrial inspection technologies together
We had a fantastic time at Fraunhofer Institute for Photonic Microsystems IPMS for the meeting on advanced and next-generation industrial inspection technologies.
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📍 Update
Master’s Thesis Advances Parallel Active Cantilever AFM Technology at Nano Analytik GmbH. Congratulations Richard Subianto !
🎓 Congratulations to Richard Subianto on the successful defense of his Master’s thesis, “Design and assembly of an Atomic Force Microscope (AFM) based on an…
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📍 Update
Seasons greetings
Celebrating the holiday season with nanoscale precision — nano analytik thanks its partners, collaborators, and customers for a successful 2025 and wishes everyone a peaceful…
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LinkedIn
Master’s Thesis at Koç University showcases advanced nanoscale transistor fabrication using Nano Analytik GmbH technology. Congratulations Taner Altinmakas !
We’re proud to see our microscope system contributing to cutting-edge academic research! Congratulations to Taner Altinmakas on successfully defending his Master’s thesis: “Mix-and-Match Fabrication of…
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📍 Update
Successful installation of CIQTEK FE SEM
nano analytik GmbH and CIQTEK announce the successful installation of a CIQTEK Field Emission Scanning Electron Microscope (FESEM) 5000X at Nano Analytik’s facility in Ilmenau,…
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📍 Update
Interview by AIP/AVS
2019: Scientists talk about Tip-Based Electron Beam Induced Deposition (TP-EBID) in AIP/AVS Interview Electron-beam induced deposition (EBID) with the help of a cantilever tip (TP-EBID)…
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📍 Update
3rd place in “Best Poster” Competition, SPIE Photomask Technology + EUV Lithography 2019
A joint poster by nano analytik GmbH and Ilmenau University of Technology was awarded third place in the “Best Poster” competition at SPIE Photomask Technology…
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📍 Update
Innovationspreis Thüringen Award
2016: AFMinSEM for single ion implantation was awarded a prize at Thüringer Innovationspreis in Weimar nano analytik GmbH is proud to announce that the single…
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Event Updates
SPIE Novel Patterning Conference
Prof. Erdem Alaca showcased nanowire sensor research enabled by nano analytik GmbH’s advanced FE-SPL technology.
SEMICON Korea 2026
High-throughput CMP metrology was presented by our partner Nexensor at SEMICON Korea using Nano Analytik GmbH’s next-generation fast AFM technology for advanced 3D integration.
STM/AFM Workshop in Zakopane, Poland, organised by the NANOSAM Centre at Jagiellonian University.
We’re glad to have presented our poster on the integrated AFM–SEM–FIB platform for correlative microscopy and nano-fabrication
MNE Conference 2023
nano analytik participated as an exhibitor and technical presenter, demonstrating the full capabilities of our active cantilever platform.
Research & Technology
A new application of our active cantilevers in nanoscale tribology!
AFM-based method employing an active piezoresistive cantilever for nanoscale wear induction and measurement.
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Ultra-Low Noise Performance achieved
Nano Analytik GmbH’s new Omega active cantilevers deliver 60 pm sensitivity with ultra-low noise performance comparable to Optical Beam Deflection systems.
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Diamond as a sensory element and its properties and applications
Final Meeting DiaQuantFab: Diamond as a sensory element and its properties and applications
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MetExSPM project gains attention
nano analytik GmbH is one of the consortium members.
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Melbourne University reports remarkable progress in research on deterministic ion implantation
A team of scientists led by the University of Melbourne employed an active-cantilever-driven vacuum AFM provided by nano analytik GmbH and integrated into an ion-implanter system for single-ion implantation technology.
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