News & Updates
Events & company updates
Conference appearances, research highlights, and the latest news from nano analytik.
Company Highlights
📍 Update
Best poster award at MNE 2026
We are excited to share that our collaborative work received the Best Poster Award in the “Structures & Devices” category at the MNE 2026 Conference…
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LinkedIn
Explore Navora AFM
A complete, plug-and-play active cantilever AFM system designed for high-resolution imaging without optical beam deflection (OBD). From industrial metrology to academic research, Navora AFM supports…
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LinkedIn
The project meeting for “Ultra-Fast Correlative Metrology PSIAFM”
The project meeting for “Ultra-Fast Correlative Metrology: PSIAFM” took place at Technische Universität Ilmenau from June 8 to 10, 2026. This EU-EUREKA project is developing…
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LinkedIn
Advancing next-generation industrial inspection technologies together
We had a fantastic time at Fraunhofer Institute for Photonic Microsystems IPMS for the meeting on advanced and next-generation industrial inspection technologies.
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📍 Update
Master’s Thesis Advances Parallel Active Cantilever AFM Technology at Nano Analytik GmbH.
🎓 Congratulations to Richard Subianto on the successful defense of his Master’s thesis, “Design and assembly of an Atomic Force Microscope (AFM) based on an…
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📍 Update
Seasons greetings
Celebrating the holiday season with nanoscale precision — nano analytik thanks its partners, collaborators, and customers for a successful 2025 and wishes everyone a peaceful…
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LinkedIn
Master’s Thesis at Koç University showcases advanced nanoscale transistor fabrication using Nano Analytik GmbH technology. Congratulations Taner Altinmakas !
We’re proud to see our microscope system contributing to cutting-edge academic research! Congratulations to Taner Altinmakas on successfully defending his Master’s thesis: “Mix-and-Match Fabrication of…
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📍 Update
Successful installation of CIQTEK FE SEM
nano analytik GmbH and CIQTEK announce the successful installation of a CIQTEK Field Emission Scanning Electron Microscope (FESEM) 5000X at Nano Analytik’s facility in Ilmenau,…
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📍 Update
Interview by AIP/AVS
2019: Scientists talk about Tip-Based Electron Beam Induced Deposition (TP-EBID) in AIP/AVS Interview Electron-beam induced deposition (EBID) with the help of a cantilever tip (TP-EBID)…
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📍 Update
3rd place in “Best Poster” Competition, SPIE Photomask Technology + EUV Lithography 2019
A joint poster by nano analytik GmbH and Ilmenau University of Technology was awarded third place in the “Best Poster” competition at SPIE Photomask Technology…
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📍 Update
Innovationspreis Thüringen Award
2016: AFMinSEM for single ion implantation was awarded a prize at Thüringer Innovationspreis in Weimar nano analytik GmbH is proud to announce that the single…
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Event Updates
MNE 2026
Dr. Bartosz Czesław Pruchnik and the team of Prof. Tomasz Piasecki from Wrocław University of Science and Technology presented our joint work on “Active Cantilever with Dual Actuator” at the MNE 2026 Conference.
SPIE Novel Patterning Conference
Prof. Erdem Alaca showcased nanowire sensor research enabled by nano analytik GmbH’s advanced FE-SPL technology.
SEMICON Korea 2026
High-throughput CMP metrology was presented by our partner Nexensor at SEMICON Korea using Nano Analytik GmbH’s next-generation fast AFM technology for advanced 3D integration.
STM/AFM Workshop in Zakopane, Poland, organised by the NANOSAM Centre at Jagiellonian University.
We’re glad to have presented our poster on the integrated AFM–SEM–FIB platform for correlative microscopy and nano-fabrication
Research & Technology
A new application of our active cantilevers in nanoscale tribology!
AFM-based method employing an active piezoresistive cantilever for nanoscale wear induction and measurement.
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Ultra-Low Noise Performance achieved
Nano Analytik GmbH’s new Omega active cantilevers deliver 60 pm sensitivity with ultra-low noise performance comparable to Optical Beam Deflection systems.
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Diamond as a sensory element and its properties and applications
Final Meeting DiaQuantFab: Diamond as a sensory element and its properties and applications
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MetExSPM project gains attention
nano analytik GmbH is one of the consortium members.
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Melbourne University reports remarkable progress in research on deterministic ion implantation
A team of scientists led by the University of Melbourne employed an active-cantilever-driven vacuum AFM provided by nano analytik GmbH and integrated into an ion-implanter system for single-ion implantation technology.
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