Event Updates
All conferences & workshops
A complete record of nano analytik's conference appearances, workshop contributions, and exhibitions — newest first.
SPIE Novel Patterning Conference
Prof. Erdem Alaca showcased nanowire sensor research enabled by nano analytik GmbH’s advanced FE-SPL technology.
SEMICON Korea 2026
High-throughput CMP metrology was presented by our partner Nexensor at SEMICON Korea using Nano Analytik GmbH’s next-generation fast AFM technology for advanced 3D integration.
STM/AFM Workshop in Zakopane, Poland, organised by the NANOSAM Centre at Jagiellonian University.
We’re glad to have presented our poster on the integrated AFM–SEM–FIB platform for correlative microscopy and nano-fabrication
MNE Conference 2023
nano analytik participated as an exhibitor and technical presenter, demonstrating the full capabilities of our active cantilever platform.
Ilmenau science night 2023
On the occasion of the Ilmenau science evening on 01.07.2023, nano analytik demonstrated its flagship product to the public
Workshop on Analytics and Measurement
nano analytik GmbH attended the workshop "Analytics and Measurement", hosted by CiS Forschungsinstitut für Mikrosensorik GmbH in Erfurt, Germany.
Workshop on Nanometrology
We presented our latest invention of active cantilever and atomic force microscope, in which a resolution in pm scale can be achieved.
SPIE Advanced Lithography 2023, San Jose, CA (USA)
nanoanalytik GmbH presented its AFM tool and underlined the advances over traditional AFM for new metrology
VI School of Vacuum Technology
Nano analytik GmbH in collaboration with Measline ltd. present actual developments in correlative microscopy and nanofabrication based on AFMinSEM technology.
Invited talk about Single Atom Dopant Lithography at SPIE Advanced Lithography
Technology for Single Dopant Atom Lithography for the fabrication of quantum computers and low power electronic devices was presented.
Presentation of novel Nano Fabrication Device at SPIE Advanced Lithography 2021
Ilmenau University of Technology presented a system manufactured by the SIOS Meßtechnik GmbH in cooperation with IMMS and nano analytik GmbH presented Nano Fabrication Machine 100 (NFM-100)
SPIE Advanced Lithography 2020
Our United States partner SEIWA Optical America Inc. exhibited the new unique active-cantilever application in integrated Optical-AFM wafer inspection system
SEMICON Japan 2019
ano analytik GmbH presented in collaboration with the SEIWA Optical Ltd. and ParCan Shanghai Ltd. an innovative solution for next generation AFM inspection technology and NEW applications of the AFMinSEM tool.
Fall Meeting of the Chinese Physical Society (CPS)
The nano analytik GmbH presented together with the local representative GermanTech Ltd. an allround-type AFMinSEM tool capable for correlative microscopy and nano fabrication.
SPIE Photomask Technology & EUV Lithography 2019
nano analytik GmbH presented at the SPIE photomask conference in Monterey (California, USA) new developments in high throughput AFM inspection systems and advanced AFMinSEM tools for correlative microscopy and nanofabrication.
9th National Nanotechnology Conference, Wroclaw (PL)
Nano Analytik GmbH showcased its flagship nanometrology solutions — AFMinSEM, NanoMETRONOM AFM, and piezoresistive probes.
Exhibition at the SPIE Advanced Lithography Conference in San José (USA)
Our United States partner SEIWA Optical America Inc. exhibited the new unique active-cantilever application in integrated Optical-AFM wafer inspection system
Photonics West in San Francisco
nano analytik GmbH was represented by its US sales representative piezosystem jena Inc. showcasing our new advanced nanoMETRONOM AFM and AFMinSEM
Conference on Micro- and Nano-Mechanics (CNM) in Wroclaw (PL)
nano analytik presented the broadest possible applications of different Scanning Probe Technologies based on active Cantilevers
Nano-Fabrication, Devices & -Metrology Workshop
Nano Analytik GmbH impresses workshop participants with next-generation AFM innovation and customer-focused nanotechnology solutions.
82nd DPG Spring Meeting of the Condensed Matter Section 2017
Nano Analytik GmbH showcased its award-winning AFM innovations and reinforced its global technology leadership
38th Symposium on Applied Surface Analysis 2016
nano analytik GmbH presented the new AFMinSEM
nanoFIS Conference 2016
nano analytik GmbH presented the ultimate active cantilever based AFM microscopy
nano analytik GmbH at Sensor+Test Exhibition
nano analytik GmbH presented the results of new scientific application of the AFMinSEM
60th International Conference on EIPBN
nano analytik presented recent developments at the company in the active cantilever AFM microscopy.
NANOSCALE-2016 Conference
nano analytik GmbH demonstrated recent developments in AFM Imaging with high-speed active cantilevers.
SPIE Advanced Lithography Conference 2015
nano analytik GmbH presented a paper on high-speed AFM-tool for metrology.
Focused Electron Beam Induced Processing FEBIP2014
nano analytik GmbH presented new results in the field of Sensor for In-Situ Monitoring of Focused Electron- and Ion-Beam Induced Processes
4th Euro AFM Forum
nano analytik GmbH presented new results in the field of High frequency and low stiffness cantilevers for high-speed AFM applications.