We’re glad to have our work represented at this year’s STM/AFM Workshop in Zakopane, Poland, organised by the NANOSAM Centre at Jagiellonian University.
Our poster presents the integrated AFM–SEM–FIB platform for correlative microscopy and nano-fabrication, developed together with the Department of Nanometrology, Faculty of Microsystem Electronics and Photonics, Wrocław University of Science and Technology, and MeasLine (https://lnkd.in/gjfCbujM).
The system uses nano analytik GmbH’s piezoresistive thermomechanical active probes, enabling compact AFM-in-SEM operation with real-time in-situ characterisation and fabrication under vacuum.
✨ A great moment to share our joint progress with the SPM community 🔬.
