Successful installation of CIQTEK FE SEM
nano analytik GmbH and CIQTEK announce the successful installation of a CIQTEK Field Emission Scanning Electron Microscope (FESEM) 5000X at Nano Analytik’s facility in Ilmenau, Germany!
The newly installed FESEM 5000X will serve as a quality-control platform for Atomic Force Microscopy (AFM) active probes and create test bench for the AFMs operating in SEM and for customer demonstrations.
🔬 About nano analytik GmbH
Nano analytik GmbH, a developer of active AFM cantilever-based devices, has customized this high resolution quality control tip inspection obligation. Our team at Ilmenau has been designing and manufacturing raster scan probe-based measuring instruments since 2010, combining experts in MEMS fabrication, electronics, control engineering, mechatronics, system production, and nanometrology. Our portfolio includes various AFM systems for nano to micro scale characterization, enabling topographic, magnetic, electrical, chemical, and mechanical analyses, as well as raster-scan probe lithography and quantum-scale measurements.
By using distinctive active probes (so-called cantilevers), the company offers a powerful alternative to conventional optical systems. Our active probe design integrates a piezoresistive sensor and a electro-thermo-mechanical actuator on the cantilever, eliminating the need for complex laser optics while maintaining full system performance.
The result: simpler handling, no sample size limitations, easy AFM integration into electron microscopes and ion-implanters, and significantly faster measurements – all with an excellent price-performance ratio
Our technology is used worldwide in research laboratories, universities, and industry, operating reliably in air, liquid, or vacuum. With a production area of 500 m² and the use of the 2,000 m² cleanroom at Technische Universität Ilmenau, we focus on “Made in Germany” quality and fair working conditions.
🤝 About CIQTEK
Our partner, CIQTEK, is a leading company in high-end analytical instrumentation, specializing in Electron Microscopy (FIB/SEM, TEM), Nuclear Magnetic Resonance (NMR), Electron Paramagnetic Resonance (EPR), and BET Surface & Pore Analyzers. With more than 700 employees, including 40% R&D professionals, CIQTEK operates 12 specialized research centers, such as the Engineering R&D Center, Ultra-Clean Pilot Testing Center, Electron Microscopy Application Center, and Precision Measurement Laboratory.
The CIQTEK FE-SEM 5000X is an ultra-high-resolution FESEM featuring advanced electron optics that reduce aberrations by 30%, achieving 0.6 nm @ 15 kV and 1.0 nm @ 1 kV resolution. Its exceptional stability and imaging performance make it ideal for nano-structural materials research and advanced semiconductor development, ranking among the most powerful and versatile instruments in its class.
A sincere thank you to our partners at CIQTEK for their excellent collaboration and support!
