Products & Solutions

Our instrument portfolio

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Navora AFM
Systems
Navora AFM
The Complete AFM System
AFM-Kit
Systems
AFM-Kit
Compact atomic force microscope for versatile labs
AFMinSEM
Systems
AFMinSEM
In-situ AFM inside a scanning electron microscope
Scanning Probe Lithography
Systems
Scanning Probe Lithography
Sub-10nm nanoscale patterning with SPL
AFM- Single Dopant Lithography
Systems
AFM- Single Dopant Lithography
Single-dopant lithography in ultra-high vacuum
AFM-Multi Platform System
Systems
AFM-Multi Platform System
Modular multi-platform UHV system
AFM Standard Cantilever
Probes
AFM Standard Cantilever
Plug-and-play Active cantilever probes
AFM Omega Cantilever
Probes
AFM Omega Cantilever
New generation-Ultrasensitive readout Active cantilever probes
AFM Probe Tips
Probes
AFM Probe Tips
A comprehensive range of tips engineered for precision, reliability and optimised performance
Kronos Controller
Controller
Kronos Controller
High-performance real-time SPM controller
Technical Services
Services
Technical Services
Expert installation, training and support