AFM-Kit
Systems — New
AFM-Kit
Compact atomic force microscope for versatile labs
Quick Specifications
Type
Atomic Force Microscope
Mounting
Simple 4-screw mounting
Scanner
Top scanner
Motion Range
35 µm × 35 µm × 10 µm
Positioning Resolution
X/Y/Z: 1 nm / 1 nm / 0.5 nm
Modes
Non-contact
Environment
Air / Liquid / Vacuum
← Back to Systems
About this product

Nano analytik AFM-Kit is a unique, simple and easy solution for AFM integration without compromising resolution or imaging speed. The compact AFM-head can be mounted via four screws and therefore offers a simple integration in every experimental or industrial set-up without any limits in the type and dimensions of samples.

The use of active cantilevers cuts down the required mechanical alignment in conventional optical read-out techniques. In this way, it is more flexible to arrange the mechanical and acoustic insulation of the system under any conditions. Moreover, the active cantilever technology is able to be utilized in air, liquids, or vacuum. Supported by a robust and high-precision drive, the auto-fast approach of the cantilever-tip is precise, reproducible, and safe. 

The AFM-Kit consists of the AFM-head unit, high-performance controller, 1-set of 7 active cantilevers, and a user-friendly, very easy-to-use, and intuitively understandable AFM Control Software. With these virtues, the nano analytik AFM-Kit is ideal integration in industrial systems, tip-based fast metrology, academic research and education, offering high performance, simplicity, versatility, and excellent results.

AFM-Kit
Performance Example
Atomic Step Resolution Measurement Result
Example AFM scan demonstrating the instrument's resolution and measurement capability on a Silicon Test Echeloned Pattern (STEPP) calibration sample with a single monoatomic step height 0,314 nm. Step edges clearly resolved with a measured height of 0.300 ± 0.010 nm.