AFM Omega Cantilever

New generation-Ultrasensitive readout Active cantilever probes

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ABOUT THIS PROBE

The Omega Active Cantilever is the latest generation of active cantilever technology from nano analytik GmbH, combining ultrasensitive piezoresistive readout with integrated thermomechanical actuation in a compact self-sensing and self-actuating probe. The technology enables reproducible atomic-resolution imaging and higher imaging performance determined by the detection bandwidth of the probe (given by the resonance frequency and the Q-factor) and capable for suitable for force sensing and unprecedented increased deflection sensing efficiency. The unique design provide effective temperature and actuator crosstalk compensation and step measurements in the range of 100pm.

The new Omega-design allows imaging in opaque environments and can be employed in spaces with extremely small geometrical constraints or imaging of photon-sensitive samples like photoresists or bio-samples. Whether in semiconductor R&D, physics, chemistry, or materials science, the Omega Active Cantilever helps researchers push the boundaries of nanoscale measurement — from routine surface characterisation to cutting-edge quantum device research.

To learn more about the underlying technology, visit our Active Cantilever Technology page.

KEY ADVANTAGES

Higher signal strength

Enhanced signal response for reliable nanoscale measurements.

Improved signal-to-noise ratio

Optimised sensing architecture provides cleaner and more stable readout.

Enhanced deflection sensitivity

Improved response even under moderate loading forces.

Faster nanoscale exploration

Higher detection bandwidth supports faster surface measurement.

TECHNICAL SPECIFICATIONS
Type
Omega Active Cantilever
Architecture
Planar Ω-shaped beam
Resonant Frequency
30–100 kHz (Adjustable to meet specific requirements)
Stiffness
5–50 N/m
Cantilever Dimensions
350 × 150 µm
Cantilever Thickness
3–7 µm
PCB-board Dimensions
25 × 11 mm
Tip-to-edge Distance
3 ± 0.5 µm
Environments
Ambient, UHV, cryogenic, liquid
Electrical Accessibility
Yes
Downloads & Resources
Product documentation
Atomic resolution with ease
White Paper
Atomic resolution with ease
Explore the low-noise performance and imaging capability of our active cantilever technology. The white paper presents high-resolution AFM measurements, including atomic-scale surface features and picometer-level height resolution.