Probes — AFM Probe Tips

Tips for every application

A comprehensive range of tips engineered for precision, reliability and optimised performance across diverse applications.

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Quality Control

Every probe, verified end-to-end

Every probe is carefully inspected through multiple verification stages — from wafer-level inspection to final electrical and optical validation — before secure packaging and delivery.

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Wafer Inspection
Defect check
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Tip Selection
Geometry & sharpness sorting
🎟️
Cantilever Mounting on PCB
Alignment & bonding
〰️
Electrical Signal Verification
Resonance signal verification
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Optical Inspection
Final optical inspection of tip
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Secure Packaging
Shock-protected packaging
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Delivery
With trusted companies

Not sure which tip fits your application?

Our team can help you choose the right one.

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