nano analytik GmbH actively participates in national and international research projects, collaborating with universities, institutes, and industry partners to advance nanoscale science and instrumentation.
The EU-EUREKA project is developing an ultra-fast, high-precision platform for metrology and defect analysis in 3D chip manufacturing by combining optical interferometric measurements with Atomic…
TU Ilmeanu, Nexensor Inc. (S.Korea), Measline (Poland), AMG Technology (Bulgaria)
Active
Oct 2024
Development of a Parallel Cantilever AFM for Ultrafast Structural Testing
EFRE 21-27 Project – Parallel Cantilever-AFM
As semiconductor technology advances, the size of structures decreases, and so does the size of defects that affect performance and production yield. These defects, known…
Ongoing
Sep 2021
Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy
MetExSPM
We proudly announce the start of the EU project “MetExSPM”. The goal is to use high-speed scanning probe microscopy for tracing localized functional properties. Prospectively…
PTB(Germany), PWR (Poland), PI (Germany), CZ SMT (Germany), GUM (Poland), CMI (Czech Republic), VTT (Finland), NA (Germany)
Completed
Oct 2019
Scanning Probe Nano Fabrication Machine
SPNF
Nanotechnology is recognized as an important key technology worldwide. Just due to the nanoscale of system components, new functionalities are available that could lead to…
Ilmenau University of Technology, SIOS Meßtechnik GmbH
Completed
May 2019
Key Technologies for Quantum Sensors.
DiaQuantFab
Standardization in the production and processing of quantum materials using the example of NV color centers in diamond for the realization of a high-precision ammeter…
Balluff GmbH, Diamond Materials GmbH, University of Leipzig, University of Stuttgart, University of Ulm, CiS Research Institute for Microsensors, nano analytik GmbH
Completed
May 2018
Multifunctional ultrafast microprobes for on‐the‐machine measurements.
EMPIR 17IND05 MicroProbes
Traceable micro-measurements of surface form and property are essential in high precision manufacturing industries where the precision control of tools and components and the quality…
Completed
Jan 2016
Development of a compact AFM unit for industrial applications.
INRAM – Industrial AFM
Development of a highly dynamic XYZ top scanner unit using the piezoelectric effect and a corresponding control electronics for use in a novel compact industrial…
nanoanalytik, Piezosystem Jena (Germany)
Completed
Feb 2014
Development of active RDD cantilevers with functionalized nano-tip.
IRLS – Functionalized-Tip
Completed
Feb 2014
Novel sensor concepts for air quality measurement.
IAQSense
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